kernel_samsung_a34x-permissive/drivers/tee/teei/400/tests/main.h

33 lines
765 B
C
Raw Normal View History

/* SPDX-License-Identifier: GPL-2.0 */
/*
* Copyright (c) 2015-2019, MICROTRUST Incorporated
* All Rights Reserved.
*
*/
#ifndef TZ_TEST_MAIN_H
#define TZ_TEST_MAIN_H
#define TZ_TEST_NAME "tz_test"
struct tzdrv_test_data {
unsigned int params[32];
unsigned char error_info[128];
int tee_error_code;
int tee_spend_time_ms;
};
#define TZDRV_IOC_MAGIC 'T'
#define TZDRV_CMD_KERNEL_CA_TEST _IOWR(TZDRV_IOC_MAGIC, 2,\
struct tzdrv_test_data)
#define TZDRV_CMD_SECURE_DRV_TEST _IOWR(TZDRV_IOC_MAGIC, 3,\
struct tzdrv_test_data)
#define TZDRV_IOC_MAXNR (10)
extern int kernel_ca_test(struct tzdrv_test_data *param);
extern int secure_drv_test(struct tzdrv_test_data *param);
#define IFASSIGN(a, b) (a = b)
#endif /* end of TZ_TEST_MAIN_H */